Built for reliability — right from the first contact - Progressive Pro Test Probes

In test environments, even a thin oxide layer can lead to unstable measurements. The result: test errors and delays.

PROGRESSIVE PRO series is engineered to eliminate exactly that. With aggressive tip styles, increased pre-load, and an extremely durable PRO-plating, the test probes ensure precise, stable contact - even on challenging surfaces.

The impact: fewer testing errors, less rework, and greater confidence in every test.

	Series
	1008/P \| ICT Test Probe 50 mil / 1.27 mm
	1012/P \| ICT Test Probe 75 mil / 1.91 mm
	1012/P \| ICT Test Probe 75 mil / 1.91 mm
	1012/P5 \| ICT Test Probe 75 mil / 1.91 mm
	1013/P \| ICT Test Probe 75 mil / 1.91 mm
	1025/P \| ICT Test Probe 100 mil / 2.54 mm
	1025/P2 \| ICT Test Probe 100 mil / 2.54 mm
	1025/P5 \| ICT Test Probe 100 mil / 2.54 mm
	1036/P \| ICT Test Probe 100 mil / 2.54 mm

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	Series
	1008/P \| ICT Test Probe 50 mil / 1.27 mm
	1012/P \| ICT Test Probe 75 mil / 1.91 mm
	1012/P \| ICT Test Probe 75 mil / 1.91 mm
	1012/P5 \| ICT Test Probe 75 mil / 1.91 mm
	1013/P \| ICT Test Probe 75 mil / 1.91 mm
	1025/P \| ICT Test Probe 100 mil / 2.54 mm
	1025/P2 \| ICT Test Probe 100 mil / 2.54 mm
	1025/P5 \| ICT Test Probe 100 mil / 2.54 mm
	1036/P \| ICT Test Probe 100 mil / 2.54 mm